HUYNH , H. T.; NGUYEN , V. H. The study of number and thickness of ingan/algan multiple quantum well structure for 365nm - 385nm ultraviolet light-emitting diodes. Journal of Technical Education Science, [S. l.], v. 12, n. 2, p. 1–9, 2021. Disponível em: https://www.jte.edu.vn/index.php/jte/article/view/360. Acesso em: 7 apr. 2026.